The Department of Electrical and Computer Engineering will continue its Seminar Series on Friday, October 11, from 12:45–1:45 p.m. in Siegel Hall, Room 118, featuring guest speaker Nandakishor Yadav, Senior Research Fellow/Visiting Research Scholar Electrical and Computer Engineering, Illinois Institute of Technology.

Yadav will talk about the reliability of electronic components such as a semiconductor memory as defined in terms of the mean time between failures (MTBF). Temperature variations and operating conditions have a substantial effect on the MTBF of individual components as well as the overall performance of the system.

Refreshments will be served.